RESISTIVE SILICON DETECTOR WITHOUT IMAGE DISTORTION
This design allows avoiding distortions in the reconstruction of the impact point of the incident particle, which are typical in detectors that use the resistive read-out methods. Using resistors with variable resistivity positioned between the readout electrodes eliminates distortions caused by incorrect charge sharing between the readout electrodes, thus achieving excellent spatial resolution across the entire pixel surface.
Resistive Silicon Detectors (RSD) have the potential for excellent spatial resolution across the entire pixel surface. However, due to the charge-sharing mechanism between the electrodes, the reconstruction of the impact point is distorted. This effect can be observed in Fig. 2 (Marketing Annex), which compares the actual impact point (in red) with the reconstructed position. The present patent surpasses the prior art by using resistors with variable resistivity. This modification ensures a uniform charge division process and eliminates distortions in reconstructing the impact point position. This effect is visible in Fig. 3 (Marketing Annex), where the reconstructed points (green) overlap with the impact point (red). The patent has been validated through simulations, reaching TRL 2. Technical development for the realization of variable resistivity resistors is currently underway.
- Particle trackers for physics experiments;
- X-ray detectors;
- Medical imaging.
- Excellent spatial resolution across the entire pixel area;